SPM probe×MSHシステムズ - List of Manufacturers, Suppliers, Companies and Products

[Standard Type] AFM/SPM Probe

High cost-performance AFM/SPM probes

This is a probe for atomic force microscopy and scanning probe microscopy. It can be used for a wide range of applications. With a reflective coating (Au, Al), it enables high-sensitivity measurements, and you can choose from many models with different cantilever shapes, resonance frequencies, and force constants that are suitable for your samples. Conductive coatings (Au, Pt, TiN, W2C), magnetic coatings, and bare probes without back coatings are also available. - Golden Probe: An excellent probe with an Au reflective coating and a curvature radius of 6 nm (typical). - ETALON Probe: An inexpensive probe with controlled tolerances for resonance frequency and force constant. It has different types of cantilevers at both ends of the chip. - TOP VISUAL Probe: A protruding probe that allows observation of the tip position from directly above, enabling precise positioning on the sample surface.

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